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A Modular Microfluidic Technology for Systematic Studies of Colloidal Semiconductor Nanocrystals 10.3791/57666-v 09:58 min
A Modular Microfluidic Technology for Systematic Studies of Colloidal Semiconductor Nanocrystals
Synthesis of a Thiol Building Block for the Crystallization of a Semiconducting Gyroidal Metal-sulfur Framework 10.3791/57455-v 12:30 min
Synthesis of a Thiol Building Block for the Crystallization of a Semiconducting Gyroidal Metal-sulfur Framework
Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering 10.3791/57415-v 07:55 min
Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering
All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics 10.3791/56861-v 11:33 min
All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
Flow-assisted Dielectrophoresis: A Low Cost Method for the Fabrication of High Performance Solution-processable Nanowire Devices 10.3791/56408-v 09:14 min
Flow-assisted Dielectrophoresis: A Low Cost Method for the Fabrication of High Performance Solution-processable Nanowire Devices
Facet-to-facet Linking of Shape-anisotropic Colloidal Cadmium Chalcogenide Nanostructures 10.3791/56009-v 09:12 min
Facet-to-facet Linking of Shape-anisotropic Colloidal Cadmium Chalcogenide Nanostructures
In Situ Synthesis of Gold Nanoparticles without Aggregation in the Interlayer Space of Layered Titanate Transparent Films 10.3791/55169-v 07:08 min
In Situ Synthesis of Gold Nanoparticles without Aggregation in the Interlayer Space of Layered Titanate Transparent Films
Plasma-assisted Molecular Beam Epitaxy of N-polar InAlN-barrier High-electron-mobility Transistors 10.3791/54775-v 10:31 min
Plasma-assisted Molecular Beam Epitaxy of N-polar InAlN-barrier High-electron-mobility Transistors
Synthesis and Characterization of Fe-doped Aluminosilicate Nanotubes with Enhanced Electron Conductive Properties 10.3791/54758-v 09:34 min
Synthesis and Characterization of Fe-doped Aluminosilicate Nanotubes with Enhanced Electron Conductive Properties
Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope 10.3791/53872-v
Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
High Resolution Phonon-assisted Quasi-resonance Fluorescence Spectroscopy 10.3791/53719-v 10:40 min
High Resolution Phonon-assisted Quasi-resonance Fluorescence Spectroscopy
Photochemical Oxidative Growth of Iridium Oxide Nanoparticles on CdSe@CdS Nanorods 10.3791/53675-v 05:41 min
Photochemical Oxidative Growth of Iridium Oxide Nanoparticles on CdSe@CdS Nanorods
Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis 10.3791/53452-v 14:11 min
Quantification of Hydrogen Concentrations in Surface and Interface Layers and Bulk Materials through Depth Profiling with Nuclear Reaction Analysis
Blast Quantification Using Hopkinson Pressure Bars 10.3791/53412-v 09:41 min
Blast Quantification Using Hopkinson Pressure Bars
Fabrication of Low Temperature Carbon Nanotube Vertical Interconnects Compatible with Semiconductor Technology 10.3791/53260-v 09:20 min
Fabrication of Low Temperature Carbon Nanotube Vertical Interconnects Compatible with Semiconductor Technology
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures 10.3791/53200-v 08:12 min
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Characterization of Nanocrystal Size Distribution using Raman Spectroscopy with a Multi-particle Phonon Confinement Model 10.3791/53026-v 06:54 min
Characterization of Nanocrystal Size Distribution using Raman Spectroscopy with a Multi-particle Phonon Confinement Model
Silicon Metal-oxide-semiconductor Quantum Dots for Single-electron Pumping 10.3791/52852-v
Silicon Metal-oxide-semiconductor Quantum Dots for Single-electron Pumping
Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles 10.3791/52815-v
Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles
Measurement of Coherence Decay in GaMnAs Using Femtosecond Four-wave Mixing 10.3791/51094-v
Measurement of Coherence Decay in GaMnAs Using Femtosecond Four-wave Mixing
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